Omron GigE Vision STC-MBCM401U3V-NIR
2.236,08 € incl. VAT
4 MP USB 3.0 camera, CMOSIS CMV4000 NIR, 89 fps, Global Shutter, C-mount, ideal for industrial applications and quality NIR inspections.
Omron GigE Vision STC-MBCM401U3V-NIR
The Omron GigE Vision STC-MBCM401U3V-NIR camera is a high-performance area scanning camera, specially designed for industrial applications that require clear and detailed monochrome images in the near infrared (NIR) spectrum. Equipped with a 4 MP CMOSIS CMV4000 NIR CMOS sensor, this camera offers superior image quality and precise details even in low light conditions. The 1″ sensor size and 5.5 µm pixel size ensure excellent light capture, and the increased infrared sensitivity makes it ideal for specialized applications. With a capture speed of 89 frames per second and a global shutter, the camera is ideal for dynamic applications. The C-mount and robust housing ensure durability and installation flexibility, making it suitable for demanding industrial environments.
Technical specifications
- Resolution: 4 MP
- Sensor type: CMOS CMOSIS CMV4000 NIR
- Sensor size: 1″
- Pixel size: 5.5 µm
- Speed: 89 fps
- Shutter type: Global Shutter
- Mount: C Mount
- Interface: USB 3.0
- Housing: Robust, suitable for industrial environments
- NIR sensitivity: Increased sensitivity in the near infrared spectrum
Benefits
- Superior image quality: The CMOSIS CMV4000 NIR sensor provides detailed and precise images.
- Fast capture: 89 frames per second, ideal for dynamic processes.
- Versatility: The C-mount and USB 3.0 interface allow for easy integration into various systems.
- Durability: The robust housing guarantees operation in harsh industrial environments.
- NIR Sensitivity: Superior performance in low light conditions thanks to sensitivity in the near infrared spectrum.
- Excellent Sensitivity: The 5.5 µm pixel size ensures efficient light capture, offering superior performance in various lighting conditions.
Fields of activity
- Industrial automation: Precise monitoring and control of production processes.
- Quality inspection: Visual inspection of products for detection defects.
- Security: Effective real-time surveillance and monitoring, including in low light conditions.
- Research and Development: Capture monochrome and NIR images for detailed analysis and documentation.
- NIR Applications: Inspection and monitoring in the near infrared spectrum for detecting features invisible in visible light.
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